A syllabus for the clinical examination of children with the revised Binet-Simon Scale for the measurement of intelligence

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dc.contributor Donated by the Howe Library of the Walter Fernald Development Center, Waltham, Massachusetts.
dc.contributor Walter E. Fernald State School. Howe Library.
dc.creator Huey, Edmund, B.
dc.date.accessioned 2014-12-04T15:00:26Z
dc.date.available 2014-12-04T15:00:26Z
dc.date.issued 1912
dc.identifier 413 p-9
dc.identifier.uri http://hdl.handle.net/10192/28938
dc.format.extent Pamphlet 39 pages
dc.language English
dc.language.iso eng
dc.publisher Warwick and York
dc.relation.ispartofseries Howe Library Historical Pamphlets on Disability Studies, circa 1810s-1960s.
dc.rights Copyright restrictions may apply. For permission to copy or use this image, contact the Robert D. Farber University Archives & Special Collections Department, Brandeis University Libraries.
dc.subject.lcsh Children with mental disabilities.
dc.subject.lcsh Intelligence testing.
dc.subject.lcsh Binet-Simon Test.
dc.subject.lcsh Children -- Intelligence testing.
dc.subject.lcsh Educational tests and measurements.
dc.title A syllabus for the clinical examination of children with the revised Binet-Simon Scale for the measurement of intelligence
dc.type still image


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